7

Size-Strain and Quantitative Phase Analysis by the Rietveld Method

Year:
1991
Language:
english
File:
PDF, 293 KB
english, 1991
11

Diffraction whole-pattern modelling study of anti-phase domains in Cu3Au

Year:
2005
Language:
english
File:
PDF, 576 KB
english, 2005
14

XRD characterization of multilayered systems

Year:
1993
Language:
english
File:
PDF, 462 KB
english, 1993
15

Residual stress in stabilized zirconia thin films prepared by r.f. magnetron sputtering

Year:
1994
Language:
english
File:
PDF, 535 KB
english, 1994
18

Fast Sintering of Nanocrystalline Copper

Year:
2012
Language:
english
File:
PDF, 972 KB
english, 2012
19

Extracting fish size using dual underwater cameras

Year:
2006
Language:
english
File:
PDF, 480 KB
english, 2006
21

Structural properties of RF-magnetron sputtered Cu2O thin films

Year:
2011
Language:
english
File:
PDF, 1.32 MB
english, 2011
23

Residual strain in deuterated Ti thin films

Year:
1998
Language:
english
File:
PDF, 181 KB
english, 1998
24

Atomistic interpretation of microstrain in diffraction line profile analysis

Year:
2013
Language:
english
File:
PDF, 1.04 MB
english, 2013
29

Enzyme immobilization by means of ultrafiltration techniques

Year:
1980
Language:
english
File:
PDF, 541 KB
english, 1980
32

Atomistic modeling of lattice relaxation in metallic nanocrystals

Year:
2013
Language:
english
File:
PDF, 1.39 MB
english, 2013
35

Disorder effects in ion-implanted niobium thin films

Year:
1985
Language:
english
File:
PDF, 147 KB
english, 1985
44

Diffraction peak profiles of surface relaxed spherical nanocrystals

Year:
2017
Language:
english
File:
PDF, 3.20 MB
english, 2017